Self-assembly monolayer impact on Schottky diode electrical properties
dc.authorid | 0000-0002-1696-4379 | |
dc.contributor.author | Mutlu, Adem | |
dc.contributor.author | Can, Mustafa | |
dc.contributor.author | Tozlu, Cem | |
dc.date.accessioned | 2025-03-24T13:15:06Z | |
dc.date.available | 2025-03-24T13:15:06Z | |
dc.date.issued | 2024 | |
dc.department | Ege Üniversitesi, Güneş Enerjisi Enstitüsü | |
dc.description.abstract | This study examines the electrical and charge transport properties of p-Si/TiO2/self-assembly monolayer (SAM)/ Al type Schottky diodes. The diodes were fabricated by applying the SAM molecule 4 '-[(3-methylphenyl)(phenyl) amino]biphenyl-4-carboxylic acid (CT21) onto titanium dioxide (TiO2) synthesized via the sol-gel method. The key parameters, including the ideality factor (n), series resistance (Rs), and barrier height (& empty;b), were used to assess the impact of CT21 on diode performance. Experimental results revealed that using CT21 at the TiO2/Al interface significantly enhances diode performance. The n decreased from 3.8 in the control diode to 1.9 with CT21. Rs was substantially reduced, and the & empty;b increased. The rectification ratio improved from 1x104 in the control diode to 1.1x105 in the CT21-modified diode. These enhancements, due to the CT21 molecule's ability to reduce interface states (Nss) and improve surface properties, underscore the potential of SAM coatings to open a new window in nanoelectronics with better performance and reliability. | |
dc.identifier.citation | Mutlu, A., Can, M., & Tozlu, C. (2025). Self-assembly monolayer impact on schottky diode electrical properties. Physica. B, Condensed Matter, 696, 416686. | |
dc.identifier.doi | 10.1016/j.physb.2024.416686 | |
dc.identifier.endpage | 6 | |
dc.identifier.issn | 09214526 | |
dc.identifier.issue | Nov | |
dc.identifier.scopus | 2-s2.0-85208194567 | |
dc.identifier.scopusquality | Q2 | |
dc.identifier.startpage | 1 | |
dc.identifier.uri | https://doi.org/10.1016/j.physb.2024.416686 | |
dc.identifier.uri | https://hdl.handle.net/11454/116891 | |
dc.identifier.volume | 696 | |
dc.identifier.wos | WOS:001353951000001 | |
dc.identifier.wosquality | Q2 | |
dc.indekslendigikaynak | Web of Science | |
dc.indekslendigikaynak | Scopus | |
dc.institutionauthor | Mutlu, Adem | |
dc.institutionauthorid | 0000-0002-1696-4379 | |
dc.language.iso | en | |
dc.publisher | Elsevier | |
dc.relation.ispartof | Physica B: Condensed Matter | |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | |
dc.rights | info:eu-repo/semantics/closedAccess | |
dc.subject | Density of states | |
dc.subject | Interface passivation | |
dc.subject | SAMs | |
dc.subject | Schottky diode | |
dc.subject | Series resistance | |
dc.subject | TiO2 | |
dc.title | Self-assembly monolayer impact on Schottky diode electrical properties | |
dc.type | Article |
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