Interval robust design under contaminated and non normal data

dc.contributor.authorZeybek, Melis
dc.date.accessioned2020-12-01T12:04:54Z
dc.date.available2020-12-01T12:04:54Z
dc.date.issued2020
dc.departmentEge Üniversitesien_US
dc.description.abstractRobust parameter design (RPD) is an effective tool, which involves experimental design and strategic modeling to determine the optimal operating conditions of a system. the usual assumptions of RPD are that normally distributed experimental data and no contamination due to outliers. and generally the parameter uncertainties in response models are neglected. However, using normal theory modeling methods for a skewed data and ignoring parameter uncertainties can create a chain of degradation in optimization and production phases such that misleading fit, poor estimated optimal operating conditions, and poor quality products. This article presents a new approach based on confidence interval (CI) response modeling for the process mean. the proposed interval robust design makes the system median unbiased for the mean and uses midpoint of the interval as a measure of location performance response. As an alternative robust estimator for the process variance response modeling, using biweight midvariance is proposed which is both resistant and robust of efficiency where normality is not met. the results further show that the proposed interval robust design gives a robust solution to the skewed structure of the data and to contaminated data. the procedure and its advantages are illustrated using two experimental design studies.en_US
dc.identifier.doi10.1080/03610926.2019.1710198
dc.identifier.endpage5418en_US
dc.identifier.issn0361-0926
dc.identifier.issn1532-415X
dc.identifier.issn0361-0926en_US
dc.identifier.issn1532-415Xen_US
dc.identifier.issue22en_US
dc.identifier.scopus2-s2.0-85078478977en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.startpage5406en_US
dc.identifier.urihttps://doi.org/10.1080/03610926.2019.1710198
dc.identifier.urihttps://hdl.handle.net/11454/62799
dc.identifier.volume49en_US
dc.identifier.wosWOS:000511646900001en_US
dc.identifier.wosqualityQ4en_US
dc.indekslendigikaynakScopusen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.language.isoenen_US
dc.publisherTaylor & Francis Incen_US
dc.relation.ispartofCommunications in Statistics-Theory and Methodsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectRobust parameter designen_US
dc.subjectdual response surfaceen_US
dc.subjectconfidence intervalen_US
dc.subjectnon normal dataen_US
dc.titleInterval robust design under contaminated and non normal dataen_US
dc.typeArticleen_US

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