A Comparative Study on Power MOSFET Reliability and Failure Modes
Küçük Resim Yok
Tarih
2019
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Ieee
Erişim Hakkı
info:eu-repo/semantics/openAccess
Özet
In this study, based on the characteristic parameters of MOSFET's degradation, reliability of MOSFETs from different companies has been compared. Same type of MOSFETs are investigated. Acceleration test are designed and devices are degraded. According to degradation data, transfer characterization is investigated and failure modes of MOSFETs have been examined. This degradation data of values have been observed %10 variance which is degradation's sign.
Açıklama
Anahtar Kelimeler
Degradation, Reliability, MOSFET, transfer characterisation, failure mode
Kaynak
2019 18Th International Symposium Infoteh-Jahorina (Infoteh)
WoS Q Değeri
N/A
Scopus Q Değeri
N/A
