The effects of overlayer thicknesses on the electrical resistivity of polycrystalline Cu/Cr double-layered thin films - Reply
Küçük Resim Yok
Tarih
1996
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Iop Publishing Ltd
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
The oscillatory behaviour of the resistivity of Cu/Cr-II double-layered films, with the Cr overlayers having thicknesses of 8.5-10.0 nm is attributed to the incommensurate-commensurate (I-C) phase transition of SDW. It is shown that the temperature-dependent resistivity of Cr/Cu multilayers described by Vitta exhibits many resistivity anomalies which might be associated with the magnetic transition of Cr.
Açıklama
Anahtar Kelimeler
Kaynak
Journal of Physics-Condensed Matter
WoS Q Değeri
N/A
Scopus Q Değeri
Cilt
8
Sayı
26
